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VLSI 2010 Annual Symposium by Voros, Nikolaos. Publication: . X, 346 p. Availability: Copies available: AUM Main Library (1),
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Design, Analysis and Test of Logic Circuits Under Uncertainty by Krishnaswamy, Smita. Publication: . XI, 123 p. 71 illus. Availability: Copies available: AUM Main Library (1),
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Models in Hardware Testing by Wunderlich, Hans-Joachim. Publication: . XIV, 257 p. Availability: Copies available: AUM Main Library (1),
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Fault-Tolerant Design by Dubrova, Elena. Publication: . XV, 185 p. 84 illus. Availability: Copies available: AUM Main Library (1),
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Predictive Technology Model for Robust Nanoelectronic Design by Cao, Yu. Publication: . XV, 173 p. Availability: Copies available: AUM Main Library (1),
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Test and Diagnosis for Small-Delay Defects by Tehranipoor, Mohammad. Publication: . XVI, 212p. 114 illus. Availability: Copies available: AUM Main Library (1),
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Soft Errors in Modern Electronic Systems by Nicolaidis, Michael. Publication: . XVIII, 318 p. Availability: Copies available: AUM Main Library (1),
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